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Effects of surface states and Si-interlayer based surface passivation on GaAs quantum wires grown by selective molecular beam epitaxy

机译:表面状态和基于Si中间层的表面钝化对选择性分子束外延生长的GaAs量子线的影响

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摘要

Effects of surface states and surface passivation on photoluminescence (PL) properties of GaAs quantum wires (QWRs) are investigated. QWR samples were grown on (001) and (111)B substrates by the selective molecular beam epitaxy (MBE) method. For surface passivation, an ultrathin (about 1 nm) Si interface control layer (Si ICL) was grown by MBE as an interlayer. In both of the selectively grown QWRs on (001) and (111)B substrates, the PL intensity reduced exponentially with reduction of their wire-to-surface distance, being coexistent with a more gradual reduction due to carrier supply reduction. The exponential reduction was explained in terms of interaction between surface states and quantum confined states leading to tunneling assisted nonradiative recombination through surface states. Surface passivation by the Si-ICL method almost completely recovered PL intensities not only for QWRs on the (001) substrate, but also for QWRs on the (111)B substrate.
机译:研究了表面态和表面钝化对GaAs量子线(QWR)的光致发光(PL)性能的影响。通过选择性分子束外延(MBE)方法,在(001)和(111)B衬底上生长QWR样品。为了进行表面钝化,MBE生长了超薄(约1 nm)的Si界面控制层(Si ICL)作为中间层。在(001)和(111)B衬底上的两种选择性生长的QWR中,PL强度随着其线到表面距离的减小而呈指数下降,并且由于载流子供应的减少而逐渐逐渐减小。根据表面态和量子约束态之间的相互作用来解释指数减少,从而导致通过表面态的隧穿辅助非辐射复合。通过Si-ICL方法进行的表面钝化几乎不仅针对(001)基板上的QWR,而且还针对(111)B基板上的QWR完全恢复了PL强度。

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